clk: Add kunit tests for fixed rate and parent data
Subsystems (8)
Stephen Boyd
maintainerv3 cover clk: Add kunit tests for fixed rate and parent data
This patch series adds unit tests for the clk fixed rate basic type and the clk registration functions that use struct clk_parent_data. To get there, we add support for loading device tree overlays onto the live DTB along with probing platform drivers to bind to device nodes in the overlays. With this series, we're able to exercise some of the code in the common clk framework that uses devicetree lookups to find parents and the fixed rate clk code that scans device tree directly and creates clks. Please review.
I Cced everyone to all the patches so they get the full context. I'm hoping I can take the whole pile through the clk tree as they almost all depend on each other.
Changes from v2 (https://lore.kernel.org/r/[email protected]):
* Overlays don't depend on __symbols__ node
* Depend on Frank's always create root node if CONFIG_OF series[1]
* Added kernel-doc to KUnit API doc
* Fixed some kernel-doc on functions
* More test cases for fixed rate clk
Changes from v1 (https://lore.kernel.org/r/[email protected]):
* Don't depend on UML, use unittest data approach to attach nodes
* Introduce overlay loading API for KUnit
* Move platform_device KUnit code to drivers/base/test
* Use #define macros for constants shared between unit tests and overlays
* Settle on "test" as a vendor prefix
* Make KUnit wrappers have "_kunit" postfix
Stephen Boyd (11):
of: Add KUnit test to confirm DTB is loaded
of: Add test managed wrappers for of_overlay_apply()/of_node_put()
dt-bindings: vendor-prefixes: Add "test" vendor for KUnit and friends
dt-bindings: test: Add KUnit empty node binding
of: Add a KUnit test for overlays and test managed APIs
platform: Add test managed platform_device/driver APIs
dt-bindings: kunit: Add fixed rate clk consumer test
clk: Add test managed clk provider/consumer APIs
clk: Add KUnit tests for clk fixed rate basic type
dt-bindings: clk: Add KUnit clk_parent_data test
clk: Add KUnit tests for clks registered with struct clk_parent_data
Documentation/dev-tools/kunit/api/clk.rst | 10 + Documentation/dev-tools/kunit/api/index.rst | 22 + Documentation/dev-tools/kunit/api/of.rst | 13 + .../dev-tools/kunit/api/platformdevice.rst | 10 + .../bindings/clock/test,clk-parent-data.yaml | 47 ++ .../bindings/test/test,clk-fixed-rate.yaml | 35 ++ .../devicetree/bindings/test/test,empty.yaml | 30 ++ .../devicetree/bindings/vendor-prefixes.yaml | 2 + drivers/base/test/Makefile | 3 + drivers/base/test/platform_kunit-test.c | 140 ++++++ drivers/base/test/platform_kunit.c | 215 ++++++++ drivers/clk/.kunitconfig | 3 + drivers/clk/Kconfig | 7 + drivers/clk/Makefile | 9 +- drivers/clk/clk-fixed-rate_test.c | 374 ++++++++++++++ drivers/clk/clk-fixed-rate_test.h | 8 + drivers/clk/clk_kunit.c | 224 +++++++++ drivers/clk/clk_parent_data_test.h | 10 + drivers/clk/clk_test.c | 459 +++++++++++++++++- drivers/clk/kunit_clk_fixed_rate_test.dtso | 19 + drivers/clk/kunit_clk_parent_data_test.dtso | 28 ++ drivers/of/.kunitconfig | 5 + drivers/of/Kconfig | 19 + drivers/of/Makefile | 4 + drivers/of/kunit_overlay_test.dtso | 9 + drivers/of/of_kunit.c | 125 +++++ drivers/of/of_test.c | 34 ++ drivers/of/overlay_test.c | 110 +++++ include/kunit/clk.h | 28 ++ include/kunit/of.h | 94 ++++ include/kunit/platform_device.h | 15 + 31 files changed, 2109 insertions(+), 2 deletions(-) create mode 100644 Documentation/dev-tools/kunit/api/clk.rst create mode 100644 Documentation/dev-tools/kunit/api/of.rst create mode 100644 Documentation/dev-tools/kunit/api/platformdevice.rst create mode 100644 Documentation/devicetree/bindings/clock/test,clk-parent-data.yaml create mode 100644 Documentation/devicetree/bindings/test/test,clk-fixed-rate.yaml create mode 100644 Documentation/devicetree/bindings/test/test,empty.yaml create mode 100644 drivers/base/test/platform_kunit-test.c create mode 100644 drivers/base/test/platform_kunit.c create mode 100644 drivers/clk/clk-fixed-rate_test.c create mode 100644 drivers/clk/clk-fixed-rate_test.h create mode 100644 drivers/clk/clk_kunit.c create mode 100644 drivers/clk/clk_parent_data_test.h create mode 100644 drivers/clk/kunit_clk_fixed_rate_test.dtso create mode 100644 drivers/clk/kunit_clk_parent_data_test.dtso create mode 100644 drivers/of/.kunitconfig create mode 100644 drivers/of/kunit_overlay_test.dtso create mode 100644 drivers/of/of_kunit.c create mode 100644 drivers/of/of_test.c create mode 100644 drivers/of/overlay_test.c create mode 100644 include/kunit/clk.h create mode 100644 include/kunit/of.h create mode 100644 include/kunit/platform_device.h
[1] https://lore.kernel.org/r/[email protected]
base-commit: fe15c26ee26efa11741a7b632e9f23b01aca4cc6
prerequisite-patch-id: 33517b96dd0768ab9c265f5721629786354ee320
prerequisite-patch-id: 909221815eeca0a2b0cdd385c76f57e185fb9e33
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Stephen Boyd
maintainerPATCH v3 1/11 of: Add KUnit test to confirm DTB is loaded
Add a simple KUnit test that confirms a DTB has been loaded, i.e. there is a root node.
--- drivers/of/.kunitconfig | 3 +++ drivers/of/Kconfig | 9 +++++++++ drivers/of/Makefile | 2 ++ drivers/of/of_test.c | 34 ++++++++++++++++++++++++++++++++++ 4 files changed, 48 insertions(+) create mode 100644 drivers/of/.kunitconfig create mode 100644 drivers/of/of_test.c
drivers/of/.kunitconfig new file +3 -0
@@ -0,0 +1,3 @@ +CONFIG_KUNIT=y +CONFIG_OF=y +CONFIG_OF_KUNIT_TEST=y
drivers/of/Kconfig +9 -0
@@ -37,6 +37,15 @@ config OF_UNITTEST If unsure, say N here. This option is not safe to enable. +config OF_KUNIT_TEST + tristate "Devicetree KUnit DTB Test" if !KUNIT_ALL_TESTS + depends on KUNIT + default KUNIT_ALL_TESTS + help + This option builds KUnit unit tests for device tree infrastructure. + + If unsure, say N here, but this option is safe to enable. + config OF_ALL_DTBS bool "Build all Device Tree Blobs" depends on COMPILE_TEST
drivers/of/Makefile +2 -0
@@ -19,4 +19,6 @@ obj-y += kexec.o endif endif +obj-$(CONFIG_OF_KUNIT_TEST) += of_test.o + obj-$(CONFIG_OF_UNITTEST) += unittest-data/
drivers/of/of_test.c new file +34 -0
@@ -0,0 +1,34 @@ +// SPDX-License-Identifier: GPL-2.0 +/* +* KUnit tests for OF APIs +*/ +#include <linux/module.h> +#include <linux/of.h> + +#include <kunit/test.h> + +/* +* Test that the root node / exists. +*/ +static void dtb_root_node_exists (struct kunit *test) +{ +KUNIT_EXPECT_NOT_ERR_OR_NULL (test,of_find_node_by_path ("/" )); +} + +static struct kunit_case dtb_test_cases[] = { +KUNIT_CASE (dtb_root_node_exists), + {} +}; + +/* +* Test suite to confirm a live DTB is loaded. +*/ +static struct kunit_suite dtb_suite = { + .name ="dtb" , + .test_cases = dtb_test_cases, +}; + +kunit_test_suites ( + &dtb_suite, +); +MODULE_LICENSE ("GPL" );
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Stephen Boyd
maintainerPATCH v3 2/11 of: Add test managed wrappers for of_overlay_apply()/of_node_put()
In reply to Stephen BoydAdd test managed wrappers for of_overlay_apply() that automatically removes the overlay when the test is finished. This API is intended for use by KUnit tests that test code which relies on 'struct device_node's and of_*() APIs.
KUnit tests will call of_overlay_apply_kunit() to load an overlay that's been built into the kernel image. When the test is complete, the overlay will be removed.
This has a few benefits:
1) It keeps the tests hermetic because the overlay is removed when the test is complete. Tests won't even be aware that an overlay was loaded in another test.
2) The overlay code can live right next to the unit test that loads it. The overlay and the unit test can be compiled into one kernel module if desired.
3) We can test different device tree configurations by loading different overlays. The overlays can be written for a specific test, and there can be many of them loaded per-test without needing to jam all possible combinations into one DTB.
4) It also allows KUnit to test device tree dependent code on any architecture, not just UML. This allows KUnit tests to test architecture specific device tree code.
There are some potential pitfalls though. Test authors need to be careful to not overwrite properties in the live tree. The easiest way to do this is to add and remove nodes with a 'kunit-' prefix, almost guaranteeing that the same node won't be present in the tree loaded at boot.
--- Documentation/dev-tools/kunit/api/index.rst | 12 ++ Documentation/dev-tools/kunit/api/of.rst | 13 ++ drivers/of/Makefile | 1 + drivers/of/of_kunit.c | 125 ++++++++++++++++++++ include/kunit/of.h | 94 +++++++++++++++ 5 files changed, 245 insertions(+) create mode 100644 Documentation/dev-tools/kunit/api/of.rst create mode 100644 drivers/of/of_kunit.c create mode 100644 include/kunit/of.h
Documentation/dev-tools/kunit/api/index.rst +12 -0
@@ -9,11 +9,15 @@ API Reference test resource functionredirection + of This page documents the KUnit kernel testing API. It is divided into the following sections: +Core KUnit API +============== + Documentation/dev-tools/kunit/api/test.rst - Documents all of the standard testing API
@@ -25,3 +29,11 @@ Documentation/dev-tools/kunit/api/resource.rst Documentation/dev-tools/kunit/api/functionredirection.rst - Documents the KUnit Function Redirection API + +Driver KUnit API +================ + +Documentation/dev-tools/kunit/api/of.rst + + - Documents the KUnit device tree (OF) API +
Documentation/dev-tools/kunit/api/of.rst new file +13 -0
@@ -0,0 +1,13 @@ +.. SPDX-License-Identifier: GPL-2.0 + +==================== +Device Tree (OF) API +==================== + +The KUnit device tree API is used to test device tree (of_*) dependent code. + +.. kernel-doc:: include/kunit/of.h + :internal: + +.. kernel-doc:: drivers/of/of_kunit.c + :export:
drivers/of/Makefile +1 -0
@@ -19,6 +19,7 @@ obj-y += kexec.o endif endif +obj-$(CONFIG_KUNIT) += of_kunit.o obj-$(CONFIG_OF_KUNIT_TEST) += of_test.o obj-$(CONFIG_OF_UNITTEST) += unittest-data/
drivers/of/of_kunit.c new file +125 -0
125 lines not on this page · raw message
include/kunit/of.h new file +94 -0
94 lines not on this page · raw message
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Rob Herring
maintainerRe: [PATCH v3 02/11] of: Add test managed wrappers for of_overlay_apply()/of_node_put()
Quoted 8 lines · Stephen Boyd
Add test managed wrappers for
of_overlay_apply()that automatically removes the overlay when the test is finished. This API is intended for use by KUnit tests that test code which relies on 'struct device_node's and of_*() APIs.KUnit tests will call
of_overlay_apply_kunit()to load an overlay that's been built into the kernel image. When the test is complete, the overlay will be removed.
What if one wants to test the removal part itself?
Rob
Stephen Boyd
maintainerRe: [PATCH v3 02/11] of: Add test managed wrappers for of_overlay_apply()/of_node_put()
Quoting Rob Herring (2023-04-06 07:35:14)
Quoted 6 lines · Stephen Boyd
Quoted 5 lines
Add test managed wrappers for
of_overlay_apply()that automatically removes the overlay when the test is finished. This API is intended for use by KUnit tests that test code which relies on 'struct device_node's and of_*() APIs.
Quoted 6 lines
Quoted 3 lines
KUnit tests will call
of_overlay_apply_kunit()to load an overlay that's been built into the kernel image. When the test is complete, the overlay will be removed.What if one wants to test the removal part itself?
We can add an of_overlay_remove_kunit() wrapper API that searches the KUnit resource list for an 'ovcs_id'. I don't have a need for that API currently so I didn't add it. As you found out, I used kunit_cleanup() instead.
Stephen Boyd
maintainerPATCH v3 3/11 dt-bindings: vendor-prefixes: Add "test" vendor for KUnit and friends
In reply to Stephen BoydAdd the vendor prefix "test" to reserve a vendor prefix for bindings that are purely for testing device tree code. This allows test code to write bindings that can be checked by the schema validator.
--- Documentation/devicetree/bindings/vendor-prefixes.yaml | 2 ++ 1 file changed, 2 insertions(+)
Documentation/devicetree/bindings/vendor-prefixes.yaml +2 -0
@@ -1331,6 +1331,8 @@ patternProperties: description: Terasic Inc. "^tesla,.*": description: Tesla, Inc. + "^test,.*": + description: Reserved for use by tests. For example, KUnit. "^tfc,.*": description: Three Five Corp "^thead,.*":
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Re: [PATCH v3 03/11] dt-bindings: vendor-prefixes: Add "test" vendor for KUnit and friends
Quoted 11 lines · Stephen Boyd
Add the vendor prefix "test" to reserve a vendor prefix for bindings that are purely for testing device tree code. This allows test code to write bindings that can be checked by the schema validator.
Cc Rob Herring <[email protected]>Cc Krzysztof Kozlowski <[email protected]>Signed-off-by Stephen Boyd <[email protected]>--- Documentation/devicetree/bindings/vendor-prefixes.yaml | 2 ++ 1 file changed, 2 insertions(+)
Stephen Boyd
maintainerPATCH v3 4/11 dt-bindings: test: Add KUnit empty node binding
In reply to Stephen BoydDescribe a binding for an empty device node used by KUnit tests to confirm overlays load properly.
--- .../devicetree/bindings/test/test,empty.yaml | 30 +++++++++++++++++++ 1 file changed, 30 insertions(+) create mode 100644 Documentation/devicetree/bindings/test/test,empty.yaml
Documentation/devicetree/bindings/test/test,empty.yaml new file +30 -0
@@ -0,0 +1,30 @@ +# SPDX-License-Identifier: (GPL-2.0-only OR BSD-2-Clause) +%YAML 1.2 +--- +$id: http://devicetree.org/schemas/test/test,empty.yaml# +$schema: http://devicetree.org/meta-schemas/core.yaml# + +title: Empty node + +maintainers: + - David Gow <[email protected]> + - Brendan Higgins <[email protected]> + +description: + An empty node to confirm tests can load device tree overlays. + +properties: + compatible: + const: test,empty + +required: + - compatible + +additionalProperties: false + +examples: + - | + kunit-node { + compatible = "test,empty"; + }; +...
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Re: [PATCH v3 04/11] dt-bindings: test: Add KUnit empty node binding
Quoted 8 lines · Stephen Boyd
Describe a binding for an empty device node used by KUnit tests to confirm overlays load properly.
Cc Rob Herring <[email protected]>Cc Krzysztof Kozlowski <[email protected]>Cc Brendan Higgins <[email protected]>Cc David Gow <[email protected]>Signed-off-by Stephen Boyd <[email protected]>
Quoted 5 lines
--- .../devicetree/bindings/test/test,empty.yaml | 30 +++++++++++++++++++ 1 file changed, 30 insertions(+) create mode 100644 Documentation/devicetree/bindings/test/test,empty.yaml
Stephen Boyd
maintainerPATCH v3 5/11 of: Add a KUnit test for overlays and test managed APIs
In reply to Stephen BoydTest the KUnit test managed overlay APIs. Confirm that platform devices are created and destroyed properly. This provides us confidence that the test managed work correctly and can be relied upon to provide tests with fake platform devices and device nodes via overlays compiled into the kernel image.
--- drivers/of/.kunitconfig | 2 + drivers/of/Kconfig | 10 +++ drivers/of/Makefile | 1 + drivers/of/kunit_overlay_test.dtso | 9 +++ drivers/of/overlay_test.c | 110 +++++++++++++++++++++++++++++ 5 files changed, 132 insertions(+) create mode 100644 drivers/of/kunit_overlay_test.dtso create mode 100644 drivers/of/overlay_test.c
drivers/of/.kunitconfig +2 -0
@@ -1,3 +1,5 @@ CONFIG_KUNIT=y CONFIG_OF=y CONFIG_OF_KUNIT_TEST=y +CONFIG_OF_OVERLAY=y +CONFIG_OF_OVERLAY_KUNIT_TEST=y
drivers/of/Kconfig +10 -0
@@ -113,6 +113,16 @@ config OF_OVERLAY While this option is selected automatically when needed, you can enable it manually to improve device tree unit test coverage. +config OF_OVERLAY_KUNIT_TEST + tristate "Device Tree overlay KUnit tests" if !KUNIT_ALL_TESTS + depends on OF_OVERLAY + depends on KUNIT + default KUNIT_ALL_TESTS + help + This option builds KUnit unit tests for the device tree overlay code. + + If unsure, say N here, but this option is safe to enable. + config OF_NUMA bool
drivers/of/Makefile +1 -0
@@ -21,5 +21,6 @@ endif obj-$(CONFIG_KUNIT) += of_kunit.o obj-$(CONFIG_OF_KUNIT_TEST) += of_test.o +obj-$(CONFIG_OF_OVERLAY_KUNIT_TEST) += overlay_test.o kunit_overlay_test.dtbo.o obj-$(CONFIG_OF_UNITTEST) += unittest-data/
drivers/of/kunit_overlay_test.dtso new file +9 -0
@@ -0,0 +1,9 @@ +// SPDX-License-Identifier: GPL-2.0 +/dts-v1/; +/plugin/; + +&{/} { + kunit-test { + compatible = "test,empty"; + }; +};
drivers/of/overlay_test.c new file +110 -0
110 lines not on this page · raw message
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Rob Herring
maintainerRe: [PATCH v3 05/11] of: Add a KUnit test for overlays and test managed APIs
Quoted 124 lines · Stephen Boyd
Test the KUnit test managed overlay APIs. Confirm that platform devices are created and destroyed properly. This provides us confidence that the test managed work correctly and can be relied upon to provide tests with fake platform devices and device nodes via overlays compiled into the kernel image.
Cc Rob Herring <[email protected]>Cc Frank Rowand <[email protected]>Signed-off-by Stephen Boyd <[email protected]>--- drivers/of/.kunitconfig | 2 + drivers/of/Kconfig | 10 +++ drivers/of/Makefile | 1 + drivers/of/kunit_overlay_test.dtso | 9 +++ drivers/of/overlay_test.c | 110 +++++++++++++++++++++++++++++ 5 files changed, 132 insertions(+) create mode 100644 drivers/of/kunit_overlay_test.dtso create mode 100644 drivers/of/overlay_test.cdrivers/of/.kunitconfig +2
-0@@ -1,3 +1,5 @@ CONFIG_KUNIT=y CONFIG_OF=y CONFIG_OF_KUNIT_TEST=y +CONFIG_OF_OVERLAY=y +CONFIG_OF_OVERLAY_KUNIT_TEST=ydrivers/of/Kconfig +10
-0@@ -113,6 +113,16 @@ config OF_OVERLAY While this option is selected automatically when needed, you can enable it manually to improve device tree unit test coverage. +config OF_OVERLAY_KUNIT_TEST + tristate "Device Tree overlay KUnit tests" if !KUNIT_ALL_TESTS + depends on OF_OVERLAY + depends on KUNIT + default KUNIT_ALL_TESTS + help + This option builds KUnit unit tests for the device tree overlay code. + + If unsure, say N here, but this option is safe to enable. + config OF_NUMA booldrivers/of/Makefile +1
-0@@ -21,5 +21,6 @@ endif obj-$(CONFIG_KUNIT) += of_kunit.o obj-$(CONFIG_OF_KUNIT_TEST) += of_test.o +obj-$(CONFIG_OF_OVERLAY_KUNIT_TEST) += overlay_test.o kunit_overlay_test.dtbo.o obj-$(CONFIG_OF_UNITTEST) += unittest-data/drivers/of/kunit_overlay_test.dtso new file +9
-0@@ -0,0 +1,9 @@ +// SPDX-License-Identifier: GPL-2.0 +/dts-v1/; +/plugin/; + +&{/} { + kunit-test { + compatible = "test,empty"; + }; +};drivers/of/overlay_test.c new file +42
-0@@ -0,0 +1,110 @@ +// SPDX-License-Identifier: GPL-2.0 +/* +* KUnit tests for device tree overlays +*/ +#include <linux/device/bus.h> +#include <linux/kconfig.h> +#include <linux/of.h> +#include <linux/platform_device.h> + +#include <kunit/of.h> +#include <kunit/test.h> + +static const char *const kunit_node_name ="kunit-test" ; +static const char *const kunit_compatible ="test,empty" ; + +/* Test that of_overlay_apply_kunit() adds a node to the live tree */ +static void of_overlay_apply_kunit_apply (struct kunit *test) +{ +struct device_node *np; + +KUNIT_ASSERT_EQ (test,0 , +of_overlay_apply_kunit (test, kunit_overlay_test)); + + np =of_find_node_by_name (NULL , kunit_node_name); +KUNIT_EXPECT_NOT_ERR_OR_NULL (test, np); +of_node_put (np); +} + +static int bus_match_np (struct device *dev,const void *data) +{ +const struct device_node *np = data; + +return np == dev->of_node; +} + +/* +* Test that of_overlay_apply_kunit() creates platform devices with the +* expected device_node +*/ +static void of_overlay_apply_kunit_platform_device (struct kunit *test) +{ +struct device *dev;
drivers/of/overlay_test.c line 52
Quoted 10 lines
drivers/of/overlay_test.c new file +10
-0+struct device_node *np; + +KUNIT_ASSERT_EQ (test,0 , +of_overlay_apply_kunit (test, kunit_overlay_test)); + + np =of_find_node_by_name (NULL , kunit_node_name); +of_node_put_kunit (test, np); +KUNIT_ASSERT_NOT_ERR_OR_NULL (test, np); + + dev =bus_find_device (&platform_bus_type,NULL , np, bus_match_np);
of_find_device_by_node()
Quoted 13 lines
drivers/of/overlay_test.c new file +13
-0+KUNIT_EXPECT_NOT_ERR_OR_NULL (test, dev); +put_device (dev); +} + +static int of_overlay_bus_match_compatible (struct device *dev,const void *data) +{ +return of_device_is_compatible (dev->of_node, data); +} + +/* Test that of_overlay_apply_kunit() cleans up after the test is finished */ +static void of_overlay_apply_kunit_cleanup (struct kunit *test) +{ +struct device *dev;
drivers/of/overlay_test.c line 75
Quoted 10 lines
drivers/of/overlay_test.c new file +10
-0+struct device_node *np; + +KUNIT_ASSERT_EQ (test,0 , +of_overlay_apply_kunit (test, kunit_overlay_test)); + + np =of_find_node_by_name (NULL , kunit_node_name); +of_node_put (np);/* Not derefing 'np' after this */ +KUNIT_ASSERT_NOT_ERR_OR_NULL (test, np); + + dev =bus_find_device (&platform_bus_type,NULL , np, bus_match_np);
And here.
drivers/of/overlay_test.c line 80
Quoted 5 lines
drivers/of/overlay_test.c new file +5
-0+put_device (dev);/* Not derefing 'device' after this */ +KUNIT_ASSERT_NOT_ERR_OR_NULL (test, dev); + +/* Remove overlay */ +kunit_cleanup (test);
I guess this is testing the cleanup. It's not that obvious given the overlay is removed by kunit_cleanup(). Not sure if anything can be done though...
Quoted 34 lines
drivers/of/overlay_test.c new file +30
-0+ + np =of_find_node_by_name (NULL , kunit_node_name); +KUNIT_EXPECT_PTR_EQ (test,NULL , np); +of_node_put (np); + + dev =bus_find_device (&platform_bus_type,NULL , kunit_compatible, + of_overlay_bus_match_compatible); +KUNIT_EXPECT_PTR_EQ (test,NULL , dev); +put_device (dev); +} + +static struct kunit_case of_overlay_apply_kunit_test_cases[] = { +KUNIT_CASE (of_overlay_apply_kunit_apply), +KUNIT_CASE (of_overlay_apply_kunit_platform_device), +KUNIT_CASE (of_overlay_apply_kunit_cleanup), + {} +}; + +/* +* Test suite for test managed device tree overlays. +*/ +static struct kunit_suite of_overlay_apply_kunit_suite = { + .name ="of_overlay_apply_kunit" , + .test_cases = of_overlay_apply_kunit_test_cases, +}; + +kunit_test_suites ( + &of_overlay_apply_kunit_suite, +); +MODULE_LICENSE ("GPL" );Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Stephen Boyd
maintainerRe: [PATCH v3 05/11] of: Add a KUnit test for overlays and test managed APIs
Quoting Rob Herring (2023-04-06 07:59:16)
Quoted 8 lines · Stephen Boyd
Quoted 7 lines
drivers/of/overlay_test.c new file +1
-0@@ -0,0 +1,110 @@ +// SPDX-License-Identifier: GPL-2.0
[...]
Quoted 11 lines
Quoted 11 lines
drivers/of/overlay_test.c new file +11
-0+/* +* Test that of_overlay_apply_kunit() creates platform devices with the +* expected device_node +*/ +static void of_overlay_apply_kunit_platform_device (struct kunit *test) +{ +struct device *dev; +struct device_node *np; + +KUNIT_ASSERT_EQ (test,0 , +of_overlay_apply_kunit (test, kunit_overlay_test));
Quoted 8 lines
drivers/of/overlay_test.c line 52
Quoted 6 lines
drivers/of/overlay_test.c new file +6
-0+ + np =of_find_node_by_name (NULL , kunit_node_name); +of_node_put_kunit (test, np); +KUNIT_ASSERT_NOT_ERR_OR_NULL (test, np); + + dev =bus_find_device (&platform_bus_type,NULL , np, bus_match_np);
of_find_device_by_node()
Done.
Quoted 10 lines
drivers/of/overlay_test.c line 80
Quoted 6 lines
drivers/of/overlay_test.c new file +5
-0+put_device (dev);/* Not derefing 'device' after this */ +KUNIT_ASSERT_NOT_ERR_OR_NULL (test, dev); + +/* Remove overlay */ +kunit_cleanup (test);I guess this is testing the cleanup. It's not that obvious given the overlay is removed by
kunit_cleanup(). Not sure if anything can be done though...
Don't think so? The test name is "of_overlay_apply_kunit_cleanup", so we need to use the kunit_cleanup() API to simulate that the "test is done". Otherwise we're testing some other API like of_overlay_remove(), which could be added as another test case. I specifically wanted to test that the kunit cleanup path does what we're expecting here.
Re: [PATCH v3 05/11] of: Add a KUnit test for overlays and test managed APIs
In reply to Stephen BoydQuoted 7 lines · Stephen Boyd
Test the KUnit test managed overlay APIs. Confirm that platform devices are created and destroyed properly. This provides us confidence that the test managed work correctly and can be relied upon to provide tests with fake platform devices and device nodes via overlays compiled into the kernel image.
The discussion around kunit_cleanup() caught my eye below, so one small comment about that.
<snip>
Quoted 9 lines
drivers/of/overlay_test.c new file +9
-0+/* Test that of_overlay_apply_kunit() cleans up after the test is finished */ +static void of_overlay_apply_kunit_cleanup (struct kunit *test) +{ +struct device *dev; +struct device_node *np; + +KUNIT_ASSERT_EQ (test,0 , +of_overlay_apply_kunit (test, kunit_overlay_test)); +
drivers/of/overlay_test.c line 80
Quoted 10 lines
drivers/of/overlay_test.c new file +10
-0+ np =of_find_node_by_name (NULL , kunit_node_name); +of_node_put (np);/* Not derefing 'np' after this */ +KUNIT_ASSERT_NOT_ERR_OR_NULL (test, np); + + dev =bus_find_device (&platform_bus_type,NULL , np, bus_match_np); +put_device (dev);/* Not derefing 'device' after this */ +KUNIT_ASSERT_NOT_ERR_OR_NULL (test, dev); + +/* Remove overlay */ +kunit_cleanup (test);
Note: this cleans up *all* resources associated with test. Right now, it's probably fine, but this probably isn't the safest approach.
Notably, two of the new/upcoming API changes rely on resource, kunit/static_stub.h and kunit_add_action() [1].
Calling kunit_cleanup() undoes all the stubs and immediately triggers all the actions.
Perhaps you can create your own local struct kunit like in [2] E.g.
struct kunit subtest; // not sure what to call this...
kunit_init_test(&subtest, "fake test", NULL);
/* use subtest */kunit_cleanup(&subtest);
There's also already-submitted code doing similar things in lib/kunit/kunit-test.c you can look at, but it's in init/exit funcs. See kunit_resource_test_init() and kunit_resource_test_exit().
[1] https://lore.kernel.org/linux-kselftest/[email protected]/
[2] https://lore.kernel.org/linux-kselftest/[email protected]/
Daniel
Stephen Boyd
maintainerRe: [PATCH v3 05/11] of: Add a KUnit test for overlays and test managed APIs
Quoting Daniel Latypov (2023-04-12 17:04:26)
Quoted 29 lines · Stephen Boyd
Quoted 9 lines
drivers/of/overlay_test.c new file +9
-0+/* Test that of_overlay_apply_kunit() cleans up after the test is finished */ +static void of_overlay_apply_kunit_cleanup (struct kunit *test) +{ +struct device *dev; +struct device_node *np; + +KUNIT_ASSERT_EQ (test,0 , +of_overlay_apply_kunit (test, kunit_overlay_test)); +drivers/of/overlay_test.c line 80
Quoted 10 lines
drivers/of/overlay_test.c new file +10
-0+ np =of_find_node_by_name (NULL , kunit_node_name); +of_node_put (np);/* Not derefing 'np' after this */ +KUNIT_ASSERT_NOT_ERR_OR_NULL (test, np); + + dev =bus_find_device (&platform_bus_type,NULL , np, bus_match_np); +put_device (dev);/* Not derefing 'device' after this */ +KUNIT_ASSERT_NOT_ERR_OR_NULL (test, dev); + +/* Remove overlay */ +kunit_cleanup (test);Note: this cleans up *all* resources associated with
test. Right now, it's probably fine, but this probably isn't the safest approach.Notably, two of the new/upcoming API changes rely on resource,
kunit/static_stub.handkunit_add_action()[1].
Callingkunit_cleanup()undoes all the stubs and immediately triggers all the actions.
Quoted 8 lines
Perhaps you can create your own local
struct kunitlike in [2] E.g.struct kunit subtest; // not sure what to call this...
kunit_init_test(&subtest, "fake test", NULL);
/* use subtest */kunit_cleanup(&subtest);
Thanks for the pointers. I can change this to be a fake sub-test as that's the intention here. I was mostly following what kunit_resource_test_static() was doing, which was calling kunit_cleanup() on the existing test that's passed in.
Stephen Boyd
maintainerPATCH v3 6/11 platform: Add test managed platform_device/driver APIs
In reply to Stephen BoydIntroduce KUnit resource wrappers around platform_driver_register(), platform_device_alloc(), and platform_device_add() so that test authors can register platform drivers/devices from their tests and have the drivers/devices automatically be unregistered when the test is done.
This makes test setup code simpler when a platform driver or platform device is needed. Add a few test cases at the same time to make sure the APIs work as intended.
--- Documentation/dev-tools/kunit/api/index.rst | 5 + .../dev-tools/kunit/api/platformdevice.rst | 10 + drivers/base/test/Makefile | 3 + drivers/base/test/platform_kunit-test.c | 140 ++++++++++++ drivers/base/test/platform_kunit.c | 215 ++++++++++++++++++ include/kunit/platform_device.h | 15 ++ 6 files changed, 388 insertions(+) create mode 100644 Documentation/dev-tools/kunit/api/platformdevice.rst create mode 100644 drivers/base/test/platform_kunit-test.c create mode 100644 drivers/base/test/platform_kunit.c create mode 100644 include/kunit/platform_device.h
Documentation/dev-tools/kunit/api/index.rst +5 -0
@@ -10,6 +10,7 @@ API Reference resource functionredirection of + platformdevice This page documents the KUnit kernel testing API. It is divided into the
@@ -37,3 +38,7 @@ Documentation/dev-tools/kunit/api/of.rst - Documents the KUnit device tree (OF) API +Documentation/dev-tools/kunit/api/platformdevice.rst + + - Documents the KUnit platform device API +
Documentation/dev-tools/kunit/api/platformdevice.rst new file +10 -0
@@ -0,0 +1,10 @@ +.. SPDX-License-Identifier: GPL-2.0 + +=================== +Platform Device API +=================== + +The KUnit platform device API is used to test platform devices. + +.. kernel-doc:: drivers/base/test/platform_kunit.c + :export:
drivers/base/test/Makefile +3 -0
@@ -3,3 +3,6 @@ obj-$(CONFIG_TEST_ASYNC_DRIVER_PROBE) += test_async_driver_probe.o obj-$(CONFIG_DRIVER_PE_KUNIT_TEST) += property-entry-test.o CFLAGS_property-entry-test.o += $(DISABLE_STRUCTLEAK_PLUGIN) + +obj-$(CONFIG_KUNIT) += platform_kunit.o +obj-$(CONFIG_KUNIT_TEST) += platform_kunit-test.o
drivers/base/test/platform_kunit-test.c new file +140 -0
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drivers/base/test/platform_kunit.c new file +215 -0
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include/kunit/platform_device.h new file +15 -0
@@ -0,0 +1,15 @@ +/* SPDX-License-Identifier: GPL-2.0 */ +#ifndef _KUNIT_PLATFORM_DRIVER_H +#define _KUNIT_PLATFORM_DRIVER_H + +struct kunit ; +struct platform_device ; +struct platform_driver ; + +struct platform_device * +platform_device_alloc_kunit (struct kunit *test,const char *name,int id); +int platform_device_add_kunit (struct kunit *test,struct platform_device *pdev); + +int platform_driver_register_kunit (struct kunit *test,struct platform_driver *drv); + +#endif
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Stephen Boyd
maintainerPATCH v3 7/11 dt-bindings: kunit: Add fixed rate clk consumer test
In reply to Stephen BoydDescribe a binding for a device that consumes a fixed rate clk in DT so that a KUnit test can get the clk registered by of_fixed_clk_setup() and test that it is setup properly.
--- .../bindings/test/test,clk-fixed-rate.yaml | 35 +++++++++++++++++++ 1 file changed, 35 insertions(+) create mode 100644 Documentation/devicetree/bindings/test/test,clk-fixed-rate.yaml
Documentation/devicetree/bindings/test/test,clk-fixed-rate.yaml new file +35 -0
@@ -0,0 +1,35 @@ +# SPDX-License-Identifier: (GPL-2.0-only OR BSD-2-Clause) +%YAML 1.2 +--- +$id: http://devicetree.org/schemas/test/test,clk-fixed-rate.yaml# +$schema: http://devicetree.org/meta-schemas/core.yaml# + +title: KUnit clk fixed rate test clk consumer + +maintainers: + - Stephen Boyd <[email protected]> + +description: + A clk consumer of a fixed rate clk used to test the fixed rate clk + implementation. + +properties: + compatible: + const: test,clk-fixed-rate + + clocks: + maxItems: 1 + +required: + - compatible + - clocks + +additionalProperties: false + +examples: + - | + clock-consumer { + compatible = "test,clk-fixed-rate"; + clocks = <&fixed_clk>; + }; +...
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Re: [PATCH v3 07/11] dt-bindings: kunit: Add fixed rate clk consumer test
Quoted 9 lines · Stephen Boyd
Describe a binding for a device that consumes a fixed rate clk in DT so that a KUnit test can get the clk registered by
of_fixed_clk_setup()and test that it is setup properly.Cc Rob Herring <[email protected]>Cc Krzysztof Kozlowski <[email protected]>Cc Brendan Higgins <[email protected]>Cc David Gow <[email protected]>Signed-off-by Stephen Boyd <[email protected]>
Quoted 5 lines
--- .../bindings/test/test,clk-fixed-rate.yaml | 35 +++++++++++++++++++ 1 file changed, 35 insertions(+) create mode 100644 Documentation/devicetree/bindings/test/test,clk-fixed-rate.yaml
Stephen Boyd
maintainerPATCH v3 8/11 clk: Add test managed clk provider/consumer APIs
In reply to Stephen BoydUnit tests are more ergonomic and simpler to understand if they don't have to hoist a bunch of code into the test harness init and exit functions. Add some test managed wrappers for the clk APIs so that clk unit tests can write more code in the actual test and less code in the harness.
Only add APIs that are used for now. More wrappers can be added in the future as necessary.
--- Documentation/dev-tools/kunit/api/clk.rst | 10 + Documentation/dev-tools/kunit/api/index.rst | 5 + drivers/clk/Makefile | 5 + drivers/clk/clk_kunit.c | 224 ++++++++++++++++++++ include/kunit/clk.h | 28 +++ 5 files changed, 272 insertions(+) create mode 100644 Documentation/dev-tools/kunit/api/clk.rst create mode 100644 drivers/clk/clk_kunit.c create mode 100644 include/kunit/clk.h
Documentation/dev-tools/kunit/api/clk.rst new file +10 -0
@@ -0,0 +1,10 @@ +.. SPDX-License-Identifier: GPL-2.0 + +======== +Clk API +======== + +The KUnit clk API is used to test clk providers and clk consumers. + +.. kernel-doc:: drivers/clk/clk_kunit.c + :export:
Documentation/dev-tools/kunit/api/index.rst +5 -0
@@ -9,6 +9,7 @@ API Reference test resource functionredirection + clk of platformdevice
@@ -34,6 +35,10 @@ Documentation/dev-tools/kunit/api/functionredirection.rst Driver KUnit API ================ +Documentation/dev-tools/kunit/api/clk.rst + + - Documents the KUnit clk API + Documentation/dev-tools/kunit/api/of.rst - Documents the KUnit device tree (OF) API
drivers/clk/Makefile +5 -0
@@ -17,6 +17,11 @@ ifeq ($(CONFIG_OF), y) obj-$(CONFIG_COMMON_CLK) += clk-conf.o endif +# KUnit specific helpers +ifeq ($(CONFIG_COMMON_CLK), y) +obj-$(CONFIG_KUNIT) += clk_kunit.o +endif + # hardware specific clock types # please keep this section sorted lexicographically by file path name obj-$(CONFIG_COMMON_CLK_APPLE_NCO) += clk-apple-nco.o
drivers/clk/clk_kunit.c new file +224 -0
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include/kunit/clk.h new file +28 -0
@@ -0,0 +1,28 @@ +/* SPDX-License-Identifier: GPL-2.0 */ +#ifndef _CLK_KUNIT_H +#define _CLK_KUNIT_H + +struct clk ; +struct clk_hw ; +struct device ; +struct device_node ; +struct kunit ; + +struct clk * +clk_get_kunit (struct kunit *test,struct device *dev,const char *con_id); +struct clk * +of_clk_get_kunit (struct kunit *test,struct device_node *np,int index); + +struct clk * +clk_hw_get_clk_kunit (struct kunit *test,struct clk_hw *hw,const char *con_id); +struct clk * +clk_hw_get_clk_prepared_enabled_kunit (struct kunit *test,struct clk_hw *hw, +const char *con_id); + +int clk_prepare_enable_kunit (struct kunit *test,struct clk *clk); + +int clk_hw_register_kunit (struct kunit *test,struct device *dev,struct clk_hw *hw); +int of_clk_hw_register_kunit (struct kunit *test,struct device_node *node, +struct clk_hw *hw); + +#endif
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Stephen Boyd
maintainerPATCH v3 9/11 clk: Add KUnit tests for clk fixed rate basic type
In reply to Stephen BoydTest that the fixed rate basic type clk works as intended.
--- drivers/clk/.kunitconfig | 3 + drivers/clk/Kconfig | 7 + drivers/clk/Makefile | 1 + drivers/clk/clk-fixed-rate_test.c | 374 +++++++++++++++++++++ drivers/clk/clk-fixed-rate_test.h | 8 + drivers/clk/kunit_clk_fixed_rate_test.dtso | 19 ++ 6 files changed, 412 insertions(+) create mode 100644 drivers/clk/clk-fixed-rate_test.c create mode 100644 drivers/clk/clk-fixed-rate_test.h create mode 100644 drivers/clk/kunit_clk_fixed_rate_test.dtso
drivers/clk/.kunitconfig +3 -0
@@ -1,5 +1,8 @@ CONFIG_KUNIT=y +CONFIG_OF=y +CONFIG_OF_OVERLAY=y CONFIG_COMMON_CLK=y CONFIG_CLK_KUNIT_TEST=y +CONFIG_CLK_FIXED_RATE_KUNIT_TEST=y CONFIG_CLK_GATE_KUNIT_TEST=y CONFIG_UML_PCI_OVER_VIRTIO=n
drivers/clk/Kconfig +7 -0
@@ -478,6 +478,13 @@ config CLK_KUNIT_TEST help Kunit tests for the common clock framework. +config CLK_FIXED_RATE_KUNIT_TEST + tristate "Basic fixed rate clk type KUnit test" if !KUNIT_ALL_TESTS + depends on KUNIT + default KUNIT_ALL_TESTS + help + KUnit tests for the basic fixed rate clk type. + config CLK_GATE_KUNIT_TEST tristate "Basic gate type Kunit test" if !KUNIT_ALL_TESTS depends on KUNIT
drivers/clk/Makefile +1 -0
@@ -6,6 +6,7 @@ obj-$(CONFIG_CLK_KUNIT_TEST) += clk_test.o obj-$(CONFIG_COMMON_CLK) += clk-divider.o obj-$(CONFIG_COMMON_CLK) += clk-fixed-factor.o obj-$(CONFIG_COMMON_CLK) += clk-fixed-rate.o +obj-$(CONFIG_CLK_FIXED_RATE_KUNIT_TEST) += clk-fixed-rate_test.o kunit_clk_fixed_rate_test.dtbo.o obj-$(CONFIG_COMMON_CLK) += clk-gate.o obj-$(CONFIG_CLK_GATE_KUNIT_TEST) += clk-gate_test.o obj-$(CONFIG_COMMON_CLK) += clk-multiplier.o
drivers/clk/clk-fixed-rate_test.c new file +374 -0
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drivers/clk/clk-fixed-rate_test.h new file +8 -0
@@ -0,0 +1,8 @@ +/* SPDX-License-Identifier: GPL-2.0 */ +#ifndef _CLK_FIXED_RATE_TEST_H +#define _CLK_FIXED_RATE_TEST_H + +#define TEST_FIXED_FREQUENCY 50000000 +#define TEST_FIXED_ACCURACY 300 + +#endif
drivers/clk/kunit_clk_fixed_rate_test.dtso new file +19 -0
@@ -0,0 +1,19 @@ +// SPDX-License-Identifier: GPL-2.0 +/dts-v1/; +/plugin/; + +#include "clk-fixed-rate_test.h" + +&{/} { + fixed_50MHz: kunit-clock { + compatible = "fixed-clock"; + #clock-cells = <0>; + clock-frequency = <TEST_FIXED_FREQUENCY>; + clock-accuracy = <TEST_FIXED_ACCURACY>; + }; + + kunit-clock-consumer { + compatible = "test,clk-fixed-rate"; + clocks = <&fixed_50MHz>; + }; +};
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Stephen Boyd
maintainerPATCH v3 10/11 dt-bindings: clk: Add KUnit clk_parent_data test
In reply to Stephen BoydDescribe a binding for a device that provides and consumes clks in DT so that a KUnit test can register clks based on the device node and test clk_hw_register() with clk_parent_data.
--- .../bindings/clock/test,clk-parent-data.yaml | 47 +++++++++++++++++++ 1 file changed, 47 insertions(+) create mode 100644 Documentation/devicetree/bindings/clock/test,clk-parent-data.yaml
Documentation/devicetree/bindings/clock/test,clk-parent-data.yaml new file +47 -0
@@ -0,0 +1,47 @@ +# SPDX-License-Identifier: (GPL-2.0-only OR BSD-2-Clause) +%YAML 1.2 +--- +$id: http://devicetree.org/schemas/clock/test,clk-parent-data.yaml# +$schema: http://devicetree.org/meta-schemas/core.yaml# + +title: Fake clk provider for clk_parent_data unit tests + +maintainers: + - Stephen Boyd <[email protected]> + +description: + A clk provider to test the struct clk_parent_data implementation in the Linux + kernel. + +properties: + compatible: + const: test,clk-parent-data + + clocks: + items: + - description: Fixed parent + - description: 50 MHz fixed parent + + clock-names: + items: + - const: parent_fwname + - const: "50" + + "#clock-cells": + const: 1 + +required: + - compatible + - "#clock-cells" + +additionalProperties: false + +examples: + - | + clock-controller { + compatible = "test,clk-parent-data"; + #clock-cells = <1>; + clocks = <&fixed_parent>, <&fixed_50MHz>; + clock-names = "parent_fwname", "50"; + }; +...
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git
Re: [PATCH v3 10/11] dt-bindings: clk: Add KUnit clk_parent_data test
Quoted 9 lines · Stephen Boyd
Describe a binding for a device that provides and consumes clks in DT so that a KUnit test can register clks based on the device node and test
clk_hw_register()withclk_parent_data.Cc Rob Herring <[email protected]>Cc Krzysztof Kozlowski <[email protected]>Cc Brendan Higgins <[email protected]>Cc David Gow <[email protected]>Signed-off-by Stephen Boyd <[email protected]>
Quoted 5 lines
--- .../bindings/clock/test,clk-parent-data.yaml | 47 +++++++++++++++++++ 1 file changed, 47 insertions(+) create mode 100644 Documentation/devicetree/bindings/clock/test,clk-parent-data.yaml
Stephen Boyd
maintainerPATCH v3 11/11 clk: Add KUnit tests for clks registered with struct clk_parent_data
In reply to Stephen BoydTest that clks registered with 'struct clk_parent_data' work as intended and can find their parents.
--- drivers/clk/Makefile | 3 +- drivers/clk/clk_parent_data_test.h | 10 + drivers/clk/clk_test.c | 459 +++++++++++++++++++- drivers/clk/kunit_clk_parent_data_test.dtso | 28 ++ 4 files changed, 498 insertions(+), 2 deletions(-) create mode 100644 drivers/clk/clk_parent_data_test.h create mode 100644 drivers/clk/kunit_clk_parent_data_test.dtso
drivers/clk/Makefile +2 -1
@@ -2,7 +2,8 @@ # common clock types obj-$(CONFIG_HAVE_CLK) += clk-devres.o clk-bulk.o clkdev.o obj-$(CONFIG_COMMON_CLK) += clk.o -obj-$(CONFIG_CLK_KUNIT_TEST) += clk_test.o +obj-$(CONFIG_CLK_KUNIT_TEST) += clk_test.o \ + kunit_clk_parent_data_test.dtbo.o obj-$(CONFIG_COMMON_CLK) += clk-divider.o obj-$(CONFIG_COMMON_CLK) += clk-fixed-factor.o obj-$(CONFIG_COMMON_CLK) += clk-fixed-rate.o
drivers/clk/clk_parent_data_test.h new file +10 -0
@@ -0,0 +1,10 @@ +/* SPDX-License-Identifier: GPL-2.0 */ +#ifndef _CLK_PARENT_DATA_TEST_H +#define _CLK_PARENT_DATA_TEST_H + +#define CLK_PARENT_DATA_1MHZ_NAME "1mhz_fixed_legacy" +#define CLK_PARENT_DATA_PARENT1 "parent_fwname" +#define CLK_PARENT_DATA_PARENT2 "50" +#define CLK_PARENT_DATA_50MHZ_NAME "50_clk" + +#endif
drivers/clk/clk_test.c +458 -1
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drivers/clk/kunit_clk_parent_data_test.dtso new file +28 -0
@@ -0,0 +1,28 @@ +// SPDX-License-Identifier: GPL-2.0 +/dts-v1/; +/plugin/; + +#include "clk_parent_data_test.h" + +&{/} { + fixed_50: kunit-clock-50MHz { + compatible = "fixed-clock"; + #clock-cells = <0>; + clock-frequency = <50000000>; + clock-output-names = CLK_PARENT_DATA_50MHZ_NAME; + }; + + fixed_parent: kunit-clock-1MHz { + compatible = "fixed-clock"; + #clock-cells = <0>; + clock-frequency = <1000000>; + clock-output-names = CLK_PARENT_DATA_1MHZ_NAME; + }; + + kunit-clock-controller { + compatible = "test,clk-parent-data"; + clocks = <&fixed_parent>, <&fixed_50>; + clock-names = CLK_PARENT_DATA_PARENT1, CLK_PARENT_DATA_PARENT2; + #clock-cells = <1>; + }; +};
Signature · 2 lines
https://git.kernel.org/pub/scm/linux/kernel/git/clk/linux.git/ https://git.kernel.org/pub/scm/linux/kernel/git/sboyd/spmi.git